Parallelism measuring device and calibration method thereof

The invention discloses a parallelism measuring device and a calibration method thereof. The parallelism measuring device comprises a data acquisition module, a data analysis module and a calibration table, the data acquisition module comprises an eddy current displacement sensor probe, an extension...

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Bibliographic Details
Main Authors XIE QIANG, AI YUMING, XU WENXIA, YU BAOCHENG, WANG MEI
Format Patent
LanguageChinese
English
Published 01.11.2022
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The invention discloses a parallelism measuring device and a calibration method thereof. The parallelism measuring device comprises a data acquisition module, a data analysis module and a calibration table, the data acquisition module comprises an eddy current displacement sensor probe, an extension cable and a sensor mounting frame; eddy current displacement sensor probes are pairwise arranged, and a plurality of pairs of eddy current displacement sensor probes are arranged on the sensor installation frame in a back-to-back mode. The data analysis module comprises an eddy current displacement sensor preposition device, a converter and an upper computer; the extension cable is connected with the eddy current displacement sensor probe and the proximitor; the converter completes data communication between the eddy current displacement sensor proximitor and an upper computer; the upper computer is used for processing and analyzing data acquired by the eddy current displacement sensor probe so as to obtain the pa
Bibliography:Application Number: CN202210802706