SMT production line process defect analysis system and analysis method based on knowledge graph

• Main Authors: LI MAOLIN, HUANG CHUNYUE, LIAO SHUAIDONG, GONG JINFENG, ZHANG HUAIQUAN
• Format: Patent
• Language: Chinese; English
• Published: 18.10.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR

The invention discloses an SMT production line process defect analysis system and analysis method based on a knowledge graph. The system comprises an SMT process defect entity extraction module, a knowledge graph construction module, an SMT process defect knowledge spectrogram unit, an SMT process defect analysis module, a man-machine interaction module, a semantic analysis module, a query statement reconstruction module and an SMT process defect analysis module which are sequentially connected to form a closed loop, the method comprises the following steps: 1) constructing an SMT process defect knowledge graph; 2) SMT process defect analysis: organic connection of hidden defect information in the process defect report text is realized, the relationship among the process defect, the process defect cause and the process defect solution becomes clearer and more visual, and the manufacturing process level of an SMT production enterprise can be effectively improved. 本发明公开了一种基于知识图谱的SMT产线工艺缺陷分析系统及分析方法，所述系统包括顺序连接形成闭