Radiation effect test method and system

• Main Authors: LUO JIAJUN, TENG RUI, ZHAO FAZHAN, ZHAN QIANGHUA, LIU HAINAN, GAO LINCHUN, QI FEITAO, ZENG CHUANBIN, LI BO
• Format: Patent
• Language: Chinese; English
• Published: 27.09.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a radiation effect test method and system, which is used for testing the radiation effect of a to-be-tested voltage source module, and comprises the following steps: when the to-be-tested voltage source module is not radiated by a radiation source module, a first output voltage output by the to-be-tested voltage source module provides a first reference voltage signal for an analog-to-digital conversion module; the analog-to-digital conversion module collects a fixed analog signal and converts the fixed analog signal into a first digital signal; when the to-be-tested voltage source module is in a state radiated by the radiation source module, a second output voltage output by the to-be-tested voltage source module provides a second reference voltage signal for the analog-to-digital conversion module, and the analog-to-digital conversion module collects a fixed analog signal and converts the fixed analog signal into a second digital signal; and obtaining a voltage difference between the