Superconducting digital circuit inductance characterization structure and method

The invention provides a superconductive digital circuit inductance characterization structure and method. The superconductive digital circuit inductance characterization structure is characterized in that a first superconductive film is connected between a first electrode layer of a first Josephson...

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Bibliographic Details
Main Authors CHEN LEI, SHI JIASHENG, ZHANG LU, WANG HUIWU, WANG ZHEN
Format Patent
LanguageChinese
English
Published 16.09.2022
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Summary:The invention provides a superconductive digital circuit inductance characterization structure and method. The superconductive digital circuit inductance characterization structure is characterized in that a first superconductive film is connected between a first electrode layer of a first Josephson junction and a second superconductive film; the third superconducting thin film is connected in front of the second superconducting thin film and the first electrode layer of the second Josephson junction; the second electrode layers of the first Josephson junction and the second Josephson junction are grounded; the first electrode is connected with the first electrode layer of the first Josephson junction; the second electrode is connected with the first electrode layer of the second Josephson junction; the third electrode is connected between the first end and the second end of the first superconducting film; the first end of the fourth electrode is connected between the first end and the second end of the secon
Bibliography:Application Number: CN202210692756