Phase calibration device calibration method and device for vector parameter test

• Main Authors: GU ZONGJING, LI MINGTAI, LIANG SHENGLI, LIU WENHUI, CAO ZHIYING, WANG YANPENG
• Format: Patent
• Language: Chinese; English
• Published: 06.09.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention belongs to the field of phase calibration device calibration, and provides a phase calibration device calibration method and device for vector parameter testing. An equivalent sampling oscilloscope reconstructs sampling signals at different position points in different periods into a s...