Phase calibration device calibration method and device for vector parameter test

• Main Authors: GU ZONGJING, LI MINGTAI, LIANG SHENGLI, LIU WENHUI, CAO ZHIYING, WANG YANPENG
• Format: Patent
• Language: Chinese; English
• Published: 06.09.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention belongs to the field of phase calibration device calibration, and provides a phase calibration device calibration method and device for vector parameter testing. An equivalent sampling oscilloscope reconstructs sampling signals at different position points in different periods into a single period range to complete measurement and acquisition of a target waveform, and according to the signal acquisition mode, the number of narrow pulse signal sampling points in a time domain signal is insufficient, and the time domain signal waveform cannot be completely reconstructed. According to the method, the problem that the frequency domain signals cannot reflect the complete information of the corresponding frequency domain signals due to the fact that the sampling points of a single time window are not maximum is solved, time domain signal sampling segments are increased, data at the corresponding positions of each segment of data are added, signal reconstruction is carried out on the time domain signal