Single-particle error evaluation system and method for high-speed DDR (Double Data Rate) memory

• Main Authors: ZHENG HONGCHAO, XU LEIPEI, DONG TAO, LI ZHE, ZHANG JIANPENG, WU YONGJUN, WANG LIANG, GOU CHUNLIANG, ZHANG XU, BI XIAO
• Format: Patent
• Language: Chinese; English
• Published: 30.08.2022
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

The invention discloses a high-speed DDR memory single-particle error evaluation system and method, and the method comprises the steps: configuring a read-write mode for a to-be-tested DDR memory circuit, providing a test code pattern, carrying out read operation, judging whether read data is the test code pattern or not, carrying out a heavy ion test or re-reading according to a judgment result, and comparing with the test code pattern of the to-be-tested DDR memory circuit, so as to evaluate the single-particle error of the to-be-tested DDR memory circuit. Judging whether a single-particle error occurs or not, comparing the count of the error with a threshold value set by single-particle function interruption, judging whether the count exceeds the threshold value or not, performing threshold value judgment again according to a judgment result, determining the type of the generated error, calculating the cross section of the single-particle error, and completing an error evaluation test. 一种高速DDR存储器单粒子错误评估系统及