Method for measuring Young modulus and bending rigidity of two-dimensional nano material

• Main Authors: DONG WENLONG, LIU LUQI, CUI XUWEI, ZHANG ZHONG
• Format: Patent
• Language: Chinese; English
• Published: 30.08.2022
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; MEASURING; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; TESTING

The invention discloses a method for measuring Young modulus and bending rigidity of a two-dimensional nano material, which comprises the following steps: forming a micron rectangular micropore array on a substrate, transferring the two-dimensional material to the micropore array, covering the rectangular micropores with the two-dimensional material to form a suspension system film, and carrying out a bubbling experiment to obtain the Young modulus and bending rigidity of the two-dimensional nano material. Uniformly-distributed loads perpendicular to the thin film are applied to the thin film on the suspended rectangular micropores so as to achieve uniaxial stretching in the short-axis direction; analyzing the morphology of the two-dimensional material, obtaining the internal and external pressure difference, carrying out stress analysis, solving the thin-layer material by adopting a thin film theory, and obtaining the Young modulus of the material in combination with the Poisson's ratio; and solving the thic