Method, system, device and equipment for measuring optical component

• Main Authors: WU YANTING, LI CHAOBO, XIONG WEI
• Format: Patent
• Language: Chinese; English
• Published: 30.08.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The invention discloses a method for measuring an optical component. The method comprises the following steps: inputting an analog sinusoidal signal to the optical component; acquiring the relationship between the frequency and the impedance of the optical component under the action of the simulated sinusoidal signal; determining the resonant frequency of the optical component and the electrical parameters of the equivalent circuit of the optical component based on the relationship between the frequency and the impedance; and determining a quality factor of the optical component based on the electrical parameters. 本发明公开了一种光学部件的测量方法，包括：向所述光学部件输入模拟正弦信号；获取所述光学部件在所述模拟正弦信号作用下的频率与阻抗的关系；基于所述频率与阻抗的关系，确定所述光学部件的谐振频率及所述光学部件等效电路的电学参数；基于所述电学参数，确定所述光学部件的品质因子。