Screening and matching method and system for power devices

The invention provides a power device screening and matching method and system, and belongs to the technical field of semiconductor device safety testing, and the method comprises the following steps: carrying out the secondary clustering of power devices according to the standardized characteristic...

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Bibliographic Details
Main Authors WANG XIANGFEN, XING RUNJIA, YAO JINYONG, OUYANG XIAOZHE
Format Patent
LanguageChinese
English
Published 26.08.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PERFORMING OPERATIONS
PHYSICS
POSTAL SORTING
SEPARATING SOLIDS FROM SOLIDS
SORTING
SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING
TESTING
TRANSPORTING
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Summary:The invention provides a power device screening and matching method and system, and belongs to the technical field of semiconductor device safety testing, and the method comprises the following steps: carrying out the secondary clustering of power devices according to the standardized characteristic parameters at different temperatures, obtaining a plurality of first temperature secondary clustering sub-piles and a plurality of second temperature secondary clustering sub-piles; taking an intersection between every two to obtain an initial matching set; judging whether the number of the power devices of which the values of the main characteristic parameters are within a preset matching range in the initial matching set is greater than or equal to a preset matching number M or not; and if yes, outputting every M power devices with the values of the main characteristic parameters in the range of 95-105% of the mean value of the main characteristic parameters in the initial matching set as a group of target power
Bibliography:Application Number: CN202210534928