Over-temperature protection circuit and test method thereof

The invention discloses an over-temperature protection circuit and a test method thereof. The over-temperature protection circuit comprises a signal generation circuit, a reference voltage circuit, a temperature detection circuit and a bias current circuit. Wherein the signal generation circuit is u...

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Bibliographic Details
Main Authors HAN XIMING, ZHANG PUJIE
Format Patent
LanguageChinese
English
Published 16.08.2022
Subjects
CONTROLLING
PHYSICS
REGULATING
SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
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Summary:The invention discloses an over-temperature protection circuit and a test method thereof. The over-temperature protection circuit comprises a signal generation circuit, a reference voltage circuit, a temperature detection circuit and a bias current circuit. Wherein the signal generation circuit is used for outputting a control signal and comprises a voltage comparator; the reference voltage circuit is coupled to one input end of the voltage comparator and responds to the control signal to provide a switchable reference voltage; the temperature detection circuit detects the temperature through the relation between the PN junction voltage and the temperature, and is coupled to the other input end of the voltage comparator; and the bias current circuit is used for outputting variable bias current and adjusting the junction voltage of the PN junction to obtain an accurate junction voltage value. According to the over-temperature protection circuit, the bias current circuit is additionally arranged, so that the ju
Bibliography:Application Number: CN202210469748