Master control room residence evaluation method, apparatus and device, and storage medium

• Main Authors: LI SHUAISHUAI, QU TIANZUO, HE FUKAI
• Format: Patent
• Language: Chinese; English
• Published: 05.08.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR

The invention discloses a main control room residence evaluation method, device and equipment and a storage medium. Comprising the steps that specified parameters of a master control room are obtained, and the specified parameters comprise environment information, a maintenance state sealing result and equipment state information; determining the state of the master control room according to the specified parameters and the matched preset conditions; and evaluating the residence of the main control room according to the state of the main control room. According to the technical scheme, various types of specified parameters such as the environment information, the maintenance state sealing result and the equipment state information of the main control room are obtained, and the residence of the main control room is evaluated from multiple angles, so that the residence condition of the main control room is accurately obtained, and the safety of operators in the main control room is effectively guaranteed. 本发明公开