ACTIVE OPTICAL PLUG FOR OPTICAL OR ELECTRICAL TESTING OF PHOTONIC PACKAGES

• Main Authors: DETOFSKY, ABRAHAM, M, COONS TODD R, RUTIGLIANO MARK, WALCZYK JOHN F
• Format: Patent
• Language: Chinese; English
• Published: 24.06.2022
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; SEMICONDUCTOR DEVICES

Embodiments described herein may relate to devices, processes, and techniques related to active optical plugs for covering optical connectors of photonic packages to protect the connectors. The active optical plug may also be used to perform a test of a photonic package, as part of a test protocol, including generating light to be sent to the photonic package and detecting light received from the photonic package. This allows optical connections and photonic packages to be tested without exposing the packaged optical connections to damage caused by dust or physical contact. Other embodiments may be described and/or claimed. 本文描述的实施例可以涉及与用于覆盖光子封装的光学连接器以保护连接器的有源光学插塞相关的设备、过程和技术。所述有源光学插塞还可以用于执行光子封装的测试，作为测试协议的一部分，包括生成要发送到所述光子封装的光以及检测从所述光子封装接收的光。这样允许测试光学连接和光子封装，而不会使封装的光学连接暴露于由灰尘或物理接触导致的损伤。可以描述和/或主张其他实施例。