Chip pin performance test method

• Main Authors: YUAN BAODI, QIAN YUXIANG, ZHOU CHUNXIAO
• Format: Patent
• Language: Chinese; English
• Published: 31.05.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a method for testing the performance of a chip pin. The testing method specifically comprises the following steps: testing mechanical properties; testing the conductivity of the pins; loading a voltage test; loading a current test; testing a level state; according to the performance grade evaluation method, the chip pin is subjected to the performance test of the electrical performance test based on the loading voltage, the loading current and the level state, so that the chip pin can have various test items in the actual test process; according to the chip pin performance testing method, the problem of one-sidedness of the testing result in the performance testing process of the chip pin is avoided, meanwhile, the electrical performance of the chip pin is tested in different aspects, the testing result of the electrical performance can comprehensively reflect the testing quality of the chip pin, then the accuracy of the testing result is guaranteed, and the testing efficiency is impro