Surge test method capable of automatically repeating surges

• Main Authors: LUO HAOZE, CUI RUIJIE, YAN HUIQIANG, KANG JIANLONG
• Format: Patent
• Language: Chinese; English
• Published: 12.04.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a surge test method capable of automatically repeating surges, which comprises the following steps of: placing a power semiconductor device to be tested on a test board, so that the tested device is safely and reliably connected with a surge current output end of a surge test platform; then, the number of surge cycles, the interval time of two surge tests and the amplitude and the cycle of surge current are set; during a surge test, source and drain voltages and surge current of a tested device are measured, and electrical parameters such as resistance and a transfer characteristic curve between electrodes are measured before and after the surge test. The electrical characteristics of a tested device subjected to surge current impact are generally changed, and whether the device is invalid or not and the performance degradation degree of the device are judged according to the change of the measured electrical parameters. According to the invention, the problem that a traditional surge