Time-of-flight mass spectrometer and detection system

The invention discloses a time-of-flight mass spectrometer and a detection system, and relates to the technical field of instrument analysis. The time-of-flight mass spectrometer comprises an ion source used for ionizing a sample to generate ions, an ion detection area used for detecting the generat...

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Bibliographic Details
Main Authors CHEN JINGHONG, MAI ZEBIN, TAN GUOBIN, XU CHUNHUA, MO TING, SU HAIBO, CHEN YANRUI
Format Patent
LanguageChinese
English
Published 29.03.2022
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Summary:The invention discloses a time-of-flight mass spectrometer and a detection system, and relates to the technical field of instrument analysis. The time-of-flight mass spectrometer comprises an ion source used for ionizing a sample to generate ions, an ion detection area used for detecting the generated ions, and an ion flying area used for transmitting the generated ion source to the ion detection area. The ion flying area comprises a plurality of ion sources, ions generated by each ion source enter the ion flying area in different directions, the ion detection area comprises a plurality of detection anode plates, and each ion source corresponds to one detection anode plate so as to respectively detect the ions generated by each ion source. During use, one ion source can be started to work, and the corresponding detection anode plate is used for detection; and then, the other ion sources are only started to work according to needs, and the detection anode plates corresponding to the other ion sources are used
Bibliography:Application Number: CN202111624806