Test system and method for module containing ADC (Analog to Digital Converter) chip

The invention discloses a test system and method for a module containing an ADC chip, the test system comprises the following modules: an upper computer, a to-be-tested module in which the ADC chip is arranged, and an analog signal source, and the analog signal source, the to-be-tested module and th...

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Bibliographic Details
Main Authors SU MIN, XU DEKAI, DANG QIANQIAN, SHU PENGFEI
Format Patent
LanguageChinese
English
Published 15.03.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention discloses a test system and method for a module containing an ADC chip, the test system comprises the following modules: an upper computer, a to-be-tested module in which the ADC chip is arranged, and an analog signal source, and the analog signal source, the to-be-tested module and the upper computer are electrically connected in sequence. The problems that in the prior art, the automation degree is low, the testing efficiency is low, and the performance index of the ADC cannot be accurately analyzed are solved. 本发明公开了一种针对含有ADC芯片的模块的测试系统及方法，该测试系统，包括以下模块：上位机、内设有ADC芯片的待测模块、模拟信号源，所述模拟信号源、所述待测模块、所述上位机依次电相连。本发明解决了现有技术存在的自动化程度低、测试效率低、无法准确分析ADC的性能指标等问题。
Bibliography:Application Number: CN202111472038