Atomic force microscope tip for interconnection

• Main Authors: TORRENTS ABAD OSCAR, ZHAO ZHENGSONG, SENGUR, ALI, SAKTI, POJA, BRODOSEANU, DANIEL
• Format: Patent
• Language: Chinese; English
• Published: 11.03.2022
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASURING; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; SEMICONDUCTOR DEVICES; TESTING

Embodiments relate to a design of an electronic device capable of preventing lateral movement between a first body and a second body. The device includes a first body including one or more atomic force microscope (AFM) tips protruding from a first surface of the first body. The device also includes a second body including one or more electrical contacts on a second surface of the second body. The second surface faces the first surface. One or more electrical contacts are pierced by the AFM tip of the first surface to prevent lateral movement between the first body and the second body. 实施例涉及能够防止第一主体和第二主体之间的横向运动的电子器件的设计。该器件包括第一主体，该第一主体包括从第一主体的第一表面突出的一个或更多个原子力显微镜(AFM)尖端。该器件还包括第二主体，该第二主体包括在第二主体的第二表面上的一个或更多个电触点。第二表面面对第一表面。一个或更多个电触点被第一表面的AFM尖端刺入，以防止第一主体和第二主体之间的横向运动。