Device and method for measuring emissivity of damaged part of test piece in normal temperature state

• Main Authors: HUA WEIZHUO, LI YIWEN, TAI HUIQIANG, LI YUQIN, WANG YANFENG, JIANG DIKAI, JIAO CHAOQIANG, ZHANGPU YOUSEN, CHEN GE, ZHAO ZHIYU
• Format: Patent
• Language: Chinese; English
• Published: 01.03.2022
• Subjects: COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; PHYSICS; RADIATION PYROMETRY; TESTING; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

The invention discloses a device and a method for measuring the emissivity of a damaged part of a test piece in a normal temperature state, belongs to the technical field of emissivity measurement, and aims to solve the problems that a common test means is simple and the measurement is not accurate enough. The infrared thermal imager receives the radiation of the surface of the measured object to determine the infrared emissivity of the measured part, so that the problem that the operation of measuring and calculating the infrared emissivity is complicated is solved, and the measuring efficiency is improved. The thermal infrared imager is used for refining the emissivity distribution condition of the damaged part on the surface of the test piece, the problem that the emissivity of the damaged part is rough in measurement is solved, emissivity measurement results of different positions of the damaged part can be obtained, and the detectability of the emissivity is improved. A calculation formula for measuring