Full-spectrum direct-reading atomic emission spectrometer combining arc excitation and echelle grating light splitting

• Main Authors: CAO ZHUORAN, CHEN BIN, DUAN FAJIE, FU XIAO, YAN YU, HUANG JINFAN
• Format: Patent
• Language: Chinese; English
• Published: 11.02.2022
• Subjects: COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING

The invention relates to a full-spectrum direct-reading atomic emission spectrometer combining arc excitation and echelle grating light splitting. Thefull-spectrum direct-reading atomic emission spectrometer comprises an arc generator, an excitation electrode, a collimating lens, a spectrum collector, an optical fiber, an incident pinhole, a collimating spherical mirror, an echelle grating, a dispersion prism, a focusing spherical mirror, a cylindrical lens and a detector; a sample which is excited by an electric arc to form plasma is located at the focus of the collimating lens, an emission spectrum is converted into parallel light beams through the collimating lens, the parallel light beams are coupled into the optical fiber through the spectrum collector, the other end of the optical fiber is connected into the incident pinhole, and emitted light entering the incident pinhole serves as a point light source and becomes parallel light beams again after being reflected by the collimating spherical mirror, and