Microscopic in-situ measurement system for magnetostrictive material under strong magnetic field

• Main Authors: LI XIAOLONG, ZHANG MINGJI, PENG CHENGYUAN, QI YUCHAO, ZHANG WENWEI
• Format: Patent
• Language: Chinese; English
• Published: 01.02.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a microscopic in-situ measurement system for a magnetostrictive material under a strong magnetic field. The system is characterized in that the magnetostrictive material is placed in an in-situ stretching measurement system and a pincer-like electromagnet by designing a specific clamping device, and observing and measuring the micro-displacement change of the magnetostrictive material by using an inverted microscope. Under the simultaneous action of a strong magnetic field and a force field, the system can be used for observing the micro-displacement change of the magnetostrictive material and measuring the deformation field and stress distribution of the magnetostrictive material, a regulation and control mechanism of the strong magnetic field to the elastic modulus change of the magnetostrictive material is established, and the microscopic in-situ characterization of the magnetostrictive material is realized. 本发明公开一种强磁场下磁致伸缩材料的微观原位测量系统，通过设计特定的夹持装置将磁致伸缩材料放置在原位拉伸测量系统和钳形电磁铁中，利用倒置显微镜对磁致伸