Method for preparing sample during electrogalvanized IF steel surface wire spot defect analysis

• Main Authors: WANG YAPENG, HU WEIZHU, WANG YAFEN, CHEN HONGYU, YANG TIANYI, WANG YU, HAI CHAO, JI LILI, GUO XIAOJING, GUO JING, GAO HONGGANG, ZUO HAIXIA, ZHAO GUANGDONG, CUI HONGTAO, SU CHONGTAO, WANG HUAN, GAO ANNI
• Format: Patent
• Language: Chinese; English
• Published: 14.01.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention relates to the technical field of electrogalvanized IF steel surface wire spot defect analysis, in particular to a method for preparing a sample during electrogalvanized IF steel surface wire spot defect analysis. The method comprises the following steps of: (1) clearly marking the position of a defect; when a sample is sheared or cut at the position of the defect, wrapping the sample with a thin rubber product, and then obtaining a sample with a certain size by cutting; putting the sample cut each time into a container filled with anhydrous alcohol, and cleaning the sample in ultrasonic waves for 30-60 minutes; exciting a zinc layer on the surface of the sample by a glow spectrometer; (5) removing the zinc layer on the surface of the electro-galvanized plate by using diluted hydrochloric acid; (6) electrolytically polishing the sample with the zinc layer removed through electrolyte; and (7) removing interference substances on the surface, and conducting ultrasonic cleaning with alcohol after el