Power capacitor local short circuit test device and control method thereof

• Main Authors: WAN KE, LIANG JUXIA, WU CHENGCHENG, FU CHAO, XIONG YI, ZUO ZHONGQIU, ZHANG CHUNLONG, TANG LIN, CAO JING, LEI XIAOYAN, CHEN LI, QIAN QINGCHUN, WANG LULU, HUANG JIARUI, LI JINYU
• Format: Patent
• Language: Chinese; English
• Published: 11.01.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses a power capacitor local short circuit test device and a control method thereof. The power capacitor local short circuit test device comprises a body, a support, a drilling mechanism, an impact mechanism and a control mechanism. The body is provided with a test chamber used for placing a capacitor. The support is mounted on the body in a transversely and longitudinally movable manner. The drilling mechanism can be installed on the support in a vertically moving mode, and the drilling mechanism is used for forming a pre-buried hole used for pre-burying a short-circuit test steel needle in a shell of the capacitor. The impact mechanism is installed on the support in a vertically movable manner, and the impact mechanism is used for impacting the short-circuit test steel needle, so that the short-circuit test steel needle is injected into the capacitor. The control mechanism is in communication connection with the drilling mechanism and the impact mechanism, and the control mechanism is use