APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING

• Main Authors: MCGRAW WILLIAM, LUST LISA M, FENG CHEN, BURNETTE JOHN, LOPAC JAMES A, HEPPNER BENJAMIN P, SHAFAI MOIN, VENKATARAYALU SURESH, SALIT MARY KATHERINE, ISELLA GIORGIO CARLO, PUCKETT MATTHEW WADE, KESTER ROBERT TIMOTHY
• Format: Patent
• Language: Chinese; English
• Published: 09.11.2021
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel. 提供了与样品测试设备相关联的方法、装置和系统。例如，示例样品测试设备可以包括：衬底层，限定了所述样品测试设备的底表面；以及波导，设置在所述衬底层上并且包括至少一个参考通道和至少一个样品通道。