SILICON PRECURSOR AND METHOD OF FABRICATING SILICON-CONTAINING THIN FILM USING THE SAME

The present disclosure relates to a vapor deposition compound which may be deposited as a thin film by vapor deposition, and specifically, to a silicon precursor which is applicable to atomic layer deposition (ALD) or chemical vapor deposition (CVD) and may be deposited at high rate, particularly by...

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Bibliographic Details
Main Authors PARK JEONG-WOO, SEOK JANG-HYEON, AN JAE-SEOK, KIM YEONG-EUN
Format Patent
LanguageChinese
English
Published 09.11.2021
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Summary:The present disclosure relates to a vapor deposition compound which may be deposited as a thin film by vapor deposition, and specifically, to a silicon precursor which is applicable to atomic layer deposition (ALD) or chemical vapor deposition (CVD) and may be deposited at high rate, particularly by high-temperature ALD, and a method for fabricating a silicon-containing thin film using the same. 本公开涉及可通过气相沉积被沉积作为薄膜的气相沉积化合物,并且具体地,涉及适用于原子层沉积(ALD)或化学气相沉积(CVD)且可以以高速沉积,特别地通过高温ALD的硅前体以及使用其制造含硅薄膜的方法。
Bibliography:Application Number: CN202110501185