SILICON PRECURSOR AND METHOD OF FABRICATING SILICON-CONTAINING THIN FILM USING THE SAME
The present disclosure relates to a vapor deposition compound which may be deposited as a thin film by vapor deposition, and specifically, to a silicon precursor which is applicable to atomic layer deposition (ALD) or chemical vapor deposition (CVD) and may be deposited at high rate, particularly by...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | Chinese English |
Published |
09.11.2021
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The present disclosure relates to a vapor deposition compound which may be deposited as a thin film by vapor deposition, and specifically, to a silicon precursor which is applicable to atomic layer deposition (ALD) or chemical vapor deposition (CVD) and may be deposited at high rate, particularly by high-temperature ALD, and a method for fabricating a silicon-containing thin film using the same.
本公开涉及可通过气相沉积被沉积作为薄膜的气相沉积化合物,并且具体地,涉及适用于原子层沉积(ALD)或化学气相沉积(CVD)且可以以高速沉积,特别地通过高温ALD的硅前体以及使用其制造含硅薄膜的方法。 |
---|---|
Bibliography: | Application Number: CN202110501185 |