Metal pipeline parameter determination method and system

• Main Authors: CHEN ZHEN, WANG SHUANG, MAO XUEFEI
• Format: Patent
• Language: Chinese; English
• Published: 05.11.2021
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING ELECTRIC VARIABLES; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; MEASURING MAGNETIC VARIABLES; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

The invention relates to a metal pipeline parameter determination method and system. The method comprises the following steps: acquiring probe coil parameters, position parameters of a probe coil and a metal pipeline and metal pipeline parameters; determining relative impedance increments of the probe coil under different frequencies according to the parameters; determining a sweep frequency curve of the relative impedance increment of the probe coil; determining the elevation angle cross point frequency according to the intersection point of the sweep frequency curves of the relative impedance increments of the two probe coils corresponding to different vertical elevation angles; determining a relation curve of the elevation angle intersection frequency logarithm with respect to the vertical distance; determining a relation curve of the pipeline thickness and the slope and a relation data table of the intercept about the pipeline thickness and the conductivity according to the slope and the intercept of the