Touch panel TP frequency hopping scanning method applied to TDDI chip

The invention provides a touch panel TP frequency hopping scanning method applied to a TDDI chip, and the method comprises the following steps: S1, in a bright screen mode, setting a default scanning mode of a touch panel TP as a first scanning mode Long H Mode; S2, detecting external noise, wherein...

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Bibliographic Details
Main Authors WANG YAZHOU, ZHANG JINLEI
Format Patent
LanguageChinese
English
Published 26.10.2021
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Summary:The invention provides a touch panel TP frequency hopping scanning method applied to a TDDI chip, and the method comprises the following steps: S1, in a bright screen mode, setting a default scanning mode of a touch panel TP as a first scanning mode Long H Mode; S2, detecting external noise, wherein when the external noise is larger than a set value, the touch panel TP is configured to enter a second scanning mode Long V Mode, in the second scanning mode, scanning is carried out when a scanning signal H_Te of the touch panel TP is at a low level, and frequency hopping setting is carried out; and when the noise is smaller than a set value, switching to a first scanning mode Long H Mode for scanning. The touch panel has the advantage that the touch panel TP can still work normally when encountering large external noise. 本发明提出了一种应用于TDDI芯片的触控面板TP跳频扫描方法,包括以下步骤:S1、亮屏模式下,设置触控面板TP的默认扫描方式是第一扫描模式Long H Mode;S2、检测外部噪声,当外部噪声大于设定值时,配置使触控面板TP进入第二扫描模式Long V Mode,该模式下当触控面板TP的扫描信号H_Te处于低电平时进行扫描,且进行跳频设置;当噪声小于设定值时,切换到第一扫描模式Long
Bibliography:Application Number: CN202110707087