CONTROLLER FOR THERMAL ANALYSIS APPARATUS, AND THERMAL ANALYSIS APPARATUS

• Main Authors: ITO SHIN, YAMAZAKI RYOKUHEI
• Format: Patent
• Language: Chinese; English
• Published: 24.09.2021
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Provided are a controller for a thermal analysis apparatus, with which thermal characteristics of a measurement target can be grasped, and a thermal analysis apparatus. A controller (51) for a thermal analysis apparatus, which is configured to measure thermal behavior accompanying a temperature change caused by one of heating and cooling of a measurement target (X, Y), is configured to: acquire an intensity of a response signal of the measurement target to an electromagnetic wave with which the measurement target is irradiated with respect to a variable of one of a time and a temperature; differentiate the intensity with respect to the variable; and output a derivative value obtained as a result of the differentiation with respect to one of the temperature and the time, or display the derivative value with respect to one of the temperature and the time on a predetermined display (53). 本发明提供热分析装置的控制部以及热分析装置，能够掌握难以进行热分析的测定对象的热特性。热分析装置进行伴随测定对象(X、Y)的加热或冷却引起的温度变化的热性能的测定，该热分析装置的控制部(51)针对时间和温度中的任意变量取得测定对象对照射在该测定对象上的