UNSUPERVISED DEFECT SEGMENTATION

• Main Authors: SOLTANMOHAMMADI ERFAN, JANI MOHIT, RAMAKRISHNAN ASHWIN
• Format: Patent
• Language: Chinese; English
• Published: 13.08.2021
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

An inspection system may receive inspection datasets from a defect inspection system associated with inspection of one or more samples, wherein an inspection data set of the plurality of inspection datasets associated with a defect includes values of two or more signal attributes and values of one o...