IV test probe row structure

• Main Authors: ZHANG FENGMING, ZHANG SHUNCHAO, LI KEGE, REN JUNLI, WU SHILIANG, MA ZHANGYAN
• Format: Patent
• Language: Chinese; English
• Published: 30.07.2021
• Subjects: CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; ELECTRICITY; GENERATION; GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention discloses an IV test probe row structure. The probe row structure comprises probe cylinders, solder strips, leads and a nylon plate. The probe row is divided into an upper part and a lower part, and each row comprises a plurality of probe cylinders in which probes are installed. Feelers are arranged at the ends of the probe cylinders, the probe cylinders are connected in series through the solder strips, the feelers of the probe cylinders are welded to the solder strips, and the solder strips are led out through the leads. The upper probe row comprises two welding strips, and the lower probe row comprises three welding strips. The solder strips are connected to different probe cylinders, and the solder strips are connected to different detection ends when battery pieces of different specifications are tested. The probe row structure is universal and has good compatibility, meanwhile, the working step of replacing the probe row can be omitted, the consumable cost of the probes is reduced, and the