Method for monitoring deviation of electrode pattern on surface of solar cell

• Main Authors: FEI ZHENGHONG, FU JINWEN, ZHOU PING, QIAN HAILONG, YUAN ZHONGCUN, CAO KUN
• Format: Patent
• Language: Chinese; English
• Published: 16.07.2021
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

The invention provides a method for monitoring deviation of an electrode pattern on the surface of a solar cell. The method comprises the following steps: acquiring a first edge of a solar cell, a second edge opposite to the first edge, and a first electrode pattern located on the first surface of the solar cell; measuring a first distance between the first contour line, close to the first edge, of the first electrode pattern and the first edge, and a second distance between the second contour line, close to the second edge, of the first electrode pattern and the second edge; calculating the position offset of the first electrode pattern relative to the solar cell, wherein the position offset is equal to the difference between the first distance and the second distance; and if the position offset is not within the offset threshold range of the first electrode pattern, determining that the first electrode pattern is unqualified. According to the invention, the offset of the surface electrode pattern relative t