Switching device for Gbit-level high-speed bus signal integrity test

• Main Authors: PENG QINGHUA, XU JINLING, SUN KUNMING, WANG XIANG, LI XIANG, GAN JUNNING, SHAN XIAOFENG, YANG HAOSHEN
• Format: Patent
• Language: Chinese; English
• Published: 06.07.2021
• Subjects: BASIC ELECTRIC ELEMENTS; CURRENT COLLECTORS; ELECTRICITY; LINE CONNECTORS

The invention relates to a switching device for a Gbit-level high-speed bus signal integrity test, which is a switching test device of a socket for a high-speed serial bus, and is characterized in that parameters such as the width of a signal line and the thickness of a paint coating layer on a printed circuit board are calculated according to specific requirements of characteristic impedance in inherent indexes of the socket for test, and microstrip line wiring is performed on a PCB (Printed Circuit Board); and the PCB which meets the requirements is obtained. And meanwhile, according to the high-frequency performance of the printed board, the adapter connector for the PCB, which meets the requirements, is selected, so that the impedance matching performance of the whole path is ensured. According to the switching device, the test switching device meeting the requirement is designed through printed board parameter design and switching connector design and model selection, the high-frequency performance stand