Memory sub-system self-testing operations

• Main Authors: BENJAMIN KEITH A, ECKEL NATHAN A
• Format: Patent
• Language: Chinese; English
• Published: 02.07.2021
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

Disclosed are memory sub-system self-testing operations. A method includes requesting, by a component of a memory sub-system controller, control of a data path associated with a memory device coupleable to the controller. The method can include generating, by the component, data corresponding to an operation to test the memory device and causing, by the component, the data to be injected to the data path such that the data is written to the memory device. The method can further include reading, by the component, the data written to the memory device and determining, by the component, whether the data read by the component from the memory device matches the data written to the memory device. 本申请案涉及存储器子系统自测操作。一种方法包含通过存储器子系统控制器的组件，请求对与可耦合到所述控制器的存储器装置相关联的数据路径的控制。所述方法可包含：通过所述组件，产生对应于测试所述存储器装置的操作的数据；以及通过所述组件，致使所述数据注入到所述数据路径，使得所述数据写入到所述存储器装置。所述方法还可包括：通过所述组件，读取写入到所述存储器装置的所述数据；以及通过所述组件，确定通过所述组件从所述存储器装置读取的所述数据是否与写入到所述存储器装置的所述数据匹配。