FILM STACK OVERLAY IMPROVEMENT FOR 3D NAND APPLICATION
Embodiments of the disclosure describe an apparatus and a method for depositing a film layer that may have minimum contribution to overlay error after a sequence of deposition and lithographic exposure processes. In one example, a method includes positioning a substrate on a substrate support in a p...
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Main Authors | , , , , , , , , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
29.06.2021
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Subjects | |
Online Access | Get full text |
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