FILM STACK OVERLAY IMPROVEMENT FOR 3D NAND APPLICATION

Embodiments of the disclosure describe an apparatus and a method for depositing a film layer that may have minimum contribution to overlay error after a sequence of deposition and lithographic exposure processes. In one example, a method includes positioning a substrate on a substrate support in a p...

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Bibliographic Details
Main Authors JORAPUR NIKHIL SUDHINDRARAO, BENJAMIN RAJ DAEMIAN RAJ, ADDEPALLI SAI SUSMITA, ROCHA-ALVAREZ JUAN CARLOS, CHICHKANOFF GREGORY EUGENE, OGATA MASAKI, ENSLOW KRISTOPHER, IBRAHIMI ZAKARIA, SRIVASTAVA SHAILENDRA, PADHI DEENESH, BAEK JONG-HOON, GUNG TZA-JING, HAN XINHAI, WANG WENJIAO
Format Patent
LanguageChinese
English
Published 29.06.2021
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