Abnormality detection method and system for image processing circuit
The present application relates to an anomaly detection method and system for an image processing circuit, the anomaly detection method comprising: generating a test image following a predetermined image configuration rule; providing the test image to an image processing circuit; providing a first i...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
18.06.2021
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Subjects | |
Online Access | Get full text |
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Summary: | The present application relates to an anomaly detection method and system for an image processing circuit, the anomaly detection method comprising: generating a test image following a predetermined image configuration rule; providing the test image to an image processing circuit; providing a first image processing parameter for processing the test image to the image processing circuit, wherein the first image processing parameter is predetermined; testing the processed test image to judge whether the image processing circuit is abnormal or not, wherein the processed test image is an image output after the test image is processed by the image processing circuit based on the first image processing parameters. By using the anomaly detection method, the image processing circuit can be effectively monitored in real time, and too many resources cannot be consumed.
本申请涉及一种用于图像处理电路的异常检测方法和系统,该异常检测方法包括:生成测试图像,该测试图像遵循预定的图像配置规则;将测试图像提供给图像处理电路;将用于处理测试图像的第一图像处理参数提供给图像处理电路,其中第一图像处理参数是预先确定的;以及对经处理的测试图像进行检测,以判定图像处理电路是否存在异常,其 |
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Bibliography: | Application Number: CN202110241971 |