Scanning type microscopic hyperspectral imaging system

• Main Authors: XU LU, LI GUIYE, HE TING, HU XUEJUAN, HUANG ZHENHONG, ZHANG JIAMING, HU KAI, CHEN LINGLING
• Format: Patent
• Language: Chinese; English
• Published: 18.06.2021
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention is suitable for the technical field of microscopic imaging, and provides a scanning type microscopic hyperspectral imaging system, which comprises an excitation light source; a sample microscopic assembly which comprises a sample table for placing a to-be-detected sample and an objective lens group for carrying out microscopy on the to-be-detected sample; a galvanometer scanning assembly which generates exciting light with different deflection angles, wherein the exciting light with different deflection angles is focused on the to-be-detected sample through the objective lens group so as to scan the to-be-detected sample; a light filtering component which is arranged on the exciting light emergent light path and the reflecting light path and is used for filtering the incident laser and the reflecting fluorescence; and an image detection module which is arranged on the reflecting light path and is used for receiving the filtered mixed fluorescence and carrying out microscopic hyperspectral imagin