Hidden danger quality inspection method and device, electronic equipment and storage medium

• Main Authors: YUAN SAI, ZHOU LIN, YIN JIYAO, LIANG XIN, CHEN WENGANG, CAO ERBIAO, YAO FANGLAI, REN YINGJUN, ZHU KAIHAO, WANG DAWEI, TAN SICHEN
• Format: Patent
• Language: Chinese; English
• Published: 28.05.2021
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; HANDLING RECORD CARRIERS; PHYSICS; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR

The invention discloses a hidden danger quality inspection method and apparatus, electronic equipment and a storage medium. The method comprises the steps of obtaining enterprise risk data of a target enterprise and to-be-inspected data of the target enterprise; determining target quality inspection data and a first text feature of the target quality inspection data by using the enterprise risk data; extracting a second text feature of the data to be subjected to quality inspection; and determining a hidden danger quality inspection result of the data to be subjected to quality inspection based on the similarity between the first text feature and the second text feature. According to the method, feature extraction and similarity calculation are carried out on the hidden danger data through the text feature extraction model, hidden danger investigation is carried out on the data to be subjected to quality inspection, quality problems existing in self-inspection hidden danger information of a target enterprise