Method for testing memory effect of micro-channel plate of low-light-level image intensifier

• Main Authors: LI JIAOJIAO, XU LINGJI, XIA XIAOJIAO, XU YOUYI, MA HUAICHAO, SONG QIGENG, ZHENG LINTAO, DONG YUHUI, LI LEI, LI JINSHA
• Format: Patent
• Language: Chinese; English
• Published: 14.05.2021
• Subjects: MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

The invention discloses a method for testing the memory effect of a micro-channel plate of a low-light-level image intensifier, which is mainly suitable for testing the memory effect of the micro-channel plate of the low-light-level image intensifier and can be used for quantitatively and accurately testing the memory effect of the micro-channel plate of the image intensifier, and provides an accurate evaluation basis for the improvement of the memory effect of the micro-channel plate of the low-light image intensifier. According to the method, the severity of the 'memory' problem of different micro-channel plates is quantitatively evaluated by testing the percentage value of the gain change of the micro-channel plates after the image intensifier is irradiated by strong light for a fixed time, and when the test variable quantity of the gain of the micro-channel plates exceeds 5%, the MCP can be judged to have 'memory' and needs to be improved. 本发明公开了一种微光像增强器微通道板记忆效应的测试方法，主要适用于微光像增强器微通道板记忆效应的测试，能够对像增强器微通道板的记忆效