VCSEL module detection method and system

The invention provides a VCSEL module detection method, which comprises the following steps of: scanning an identification code related to a first VCSEL chip in a VCSEL module to obtain identification information of the first VCSEL chip; acquiring a first metallographic image of the first VCSEL chip...

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Bibliographic Details
Main Author WANG CHANGGONG
Format Patent
LanguageChinese
English
Published 04.05.2021
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The invention provides a VCSEL module detection method, which comprises the following steps of: scanning an identification code related to a first VCSEL chip in a VCSEL module to obtain identification information of the first VCSEL chip; acquiring a first metallographic image of the first VCSEL chip under the visual angle of the metallographic microscope to determine whether the quality of each VCSEL light emitting unit in the first VCSEL chip is qualified; when the metallographic microscope is in a lamplight closed state, acquiring a first near-field image of the first VCSEL chip under a visual angle of the metallographic microscope so as to confirm whether each VCSEL light-emitting unit in the first VCSEL chip has a defective pixel or not; and in response to determining that each VCSEL light emitting unit in the first VCSEL chip is qualified and the number of defective pixels in each VCSEL light emitting unit in the first VCSEL chip is lower than a preset proportion, determining that the first VCSEL chip in
Bibliography:Application Number: CN20191148773