Detachable high-frequency testing device and vertical probe head thereof

The invention discloses a detachable high-frequency testing device and a vertical probe head thereof. The detachable high-frequency testing device comprises: a vertical probe head, a signal transmission piece installed on the vertical probe head and a spacing conversion plate connected with the vert...

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Bibliographic Details
Main Authors XIE KAIJIE, LI WENCONG
Format Patent
LanguageChinese
English
Published 27.04.2021
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention discloses a detachable high-frequency testing device and a vertical probe head thereof. The detachable high-frequency testing device comprises: a vertical probe head, a signal transmission piece installed on the vertical probe head and a spacing conversion plate connected with the vertical probe head, wherein the vertical probe head comprises a holding seat comprising a first guide plate unit and a second guide plate unit, a high-frequency transmission line and a grounding line formed on the inner surface of the second guide plate unit, and a plurality of conductive probes arranged on the holding seat in a penetrating mode; and a high-frequency probe abutting against the high-frequency transmission line in a separable mode; and a signal transmission member connected to the high-frequency transmission line, so that the signal transmission member and the high-frequency probe are electrically coupled to each other. According to the detachable high-frequency testing device and the vertical probe hea
Bibliography:Application Number: CN201911016681