Open frame gantry probing system

Apparatus is provided for probing both sides of a high density printed circuit board 92 and includes an open frame 14 extending around the circuit board when it is held in a test position by a circuit board carrier 78. The frame includes two parallel rail structures 20, 22 extending above, and at op...

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Bibliographic Details
Main Authors JIANNANG LO, MICHAEL SERVEDIO, JR. JAMES EDWARD BOYETTE
Format Patent
LanguageEnglish
Published 26.06.1996
Edition6
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Apparatus is provided for probing both sides of a high density printed circuit board 92 and includes an open frame 14 extending around the circuit board when it is held in a test position by a circuit board carrier 78. The frame includes two parallel rail structures 20, 22 extending above, and at opposite ends of, the circuit board in the test position. The frame also includes another two parallel rail structures 20, 22 extending below, and at opposite ends of, the circuit board. The upper and lower rail structures extend perpendicularly to one another, and are fastened together at the corners of the frame by means of compression bolt assemblies 48. Two gantry structures 12 are moved in a first direction between the upper rail structures, while two other gantry structures are moved in a direction perpendicular to the first direction between the lower rail structures. A carriage 36 moves along each gantry structure, and a probe 56 is mounted on each carriage to be moved toward and away from the adjacent surface of the circuit board. The circuit board is moved by a board carrier between a position, outside the frame, in which it is loaded and unloaded, and the test position.
Bibliography:Application Number: CN19941013536