Fault analysis method
The invention relates to a method for fault analysis of a device having a plurality of interacting components, the method comprising the following steps: importing data relating to a fault event; analyzing the data to assign a device identifier to each associated device; analyzing the data to assign...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
19.03.2021
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a method for fault analysis of a device having a plurality of interacting components, the method comprising the following steps: importing data relating to a fault event; analyzing the data to assign a device identifier to each associated device; analyzing the data to assign a fault data set indicative of a related fault to each device having a related assigned device identifier, respectively, to thereby form a device fault data set in each case; forming a set data set by assigning the device fault data set to the same fault event; augmenting the set of datasets with additional data from an OEM database containing data relating to components of the device; generating a distribution map data set by analyzing the expanded set data set, the distribution map data set indicating the presence of components in each device; and determining an occurrence frequency of the components.
本发明涉及一种用于具有多个相互作用的部件的设备的故障分析的方法,包含以下步骤:导入与故障事件有关的数据;分析该数据以便为每个相关的设备分配设备标识符;分析该数据以便分别向具有相关的已分配设备标识符的每个设备分配指示相关故障的 |
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Bibliography: | Application Number: CN202010976199 |