Thermal resistance measuring instrument calibration method and device based on thermal resistance standard component
The invention is suitable for the technical field of semiconductors and provides a thermal resistance measuring instrument calibration method and device based on a thermal resistance standard component. The method comprises steps of controlling the thermal resistance standard part to be at a preset...
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Main Authors | , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
19.03.2021
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Subjects | |
Online Access | Get full text |
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Summary: | The invention is suitable for the technical field of semiconductors and provides a thermal resistance measuring instrument calibration method and device based on a thermal resistance standard component. The method comprises steps of controlling the thermal resistance standard part to be at a preset temperature, inputting a preset test current to the thermal resistance standard part, and measuringa first junction voltage of the thermal resistance standard part, determining a temperature calibration curve of the thermal resistance standard component according to the preset temperature and the first junction voltage; inputting a preset working current to the thermal resistance standard part, and measuring a second junction voltage of the thermal resistance standard part after the junction temperature of the thermal resistance standard part is stable; based on the temperature calibration curve and the second junction voltage, determining the junction temperature of the thermal resistancestandard component under t |
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Bibliography: | Application Number: CN202011133324 |