Power device quality grade classification method

• Main Authors: LUO JIAJUN, ZHANG YULONG, DONG CHENXI, SU HONGYUAN, WANG LULU, LIU MENGXIN, HAN ZHENGSHENG, HAO LE
• Format: Patent
• Language: Chinese; English
• Published: 12.03.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a power device quality grade classification method. The method comprises the steps of: providing power devices; performing a thermal response test and an electrical parameter test on the power device, and performing calculation to obtain a variable quantity; determining a standard value domain and an allowable change range, and judging whether a thermal response test resultand an electrical parameter test result meet the standard value domain or not; judging whether the variation exceeds an allowable variation range or not; establishing a quality grade classification standard, wherein the quality grade classification standard comprises a quality grade, the quality grade comprises a test index of a thermal response test, a test index of an electrical parameter test and a judgment index corresponding to a variable quantity, each test index and each judgment index correspond to a reference range, and each reference range corresponds to a score; based on the thermalresponse test result, the