Dielectric material testing system, method, device and platform

• Main Authors: SONG XIBIN, ZHU HENG, XI HONGLIANG, CUI SHUZHI, AI LIAODONG, YANG HONGWEI
• Format: Patent
• Language: Chinese; English
• Published: 05.03.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The invention provides a dielectric material testing system, method, device and platform. The system comprises a network analyzer, a dynamic cut-off frequency filter, a dynamic frequency reading device and a quasi-optical cavity, wherein after electromagnetic waves output by the network analyzer are filtered by the dynamic cut-off frequency filter, resonance is formed in the quasi-optical cavity,the filtering parameters of the dynamic cut-off frequency filter are determined based on the quasi-optical cavity resonant frequency of the quasi-optical cavity, and the quasi-optical cavity resonantfrequency is acquired by the dynamic frequency reading device. According to the system, the method, the device and the platform provided by the invention, the non-TEM00q mode in a quasi-optical cavityis filtered by additionally arranging a dynamic cut-off frequency filter and a dynamic frequency reading device, so that the measurement of the Q value is not influenced by the non-TEM00q mode, and the authenticity of the Q va