Amorphous Layers for Reducing Copper Diffusion and Method Forming Same

A method includes depositing an etch stop layer over a first conductive feature, performing a first treatment to amorphize the etch stop layer, depositing a dielectric layer over the n etch stop layer, etching the dielectric layer to form an opening, etching-through the etch stop layer to extend the...

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Bibliographic Details
Main Authors LIU DINGYI, XU KAIXIANG, WU JIAYU, LIN ZHINAN
Format Patent
LanguageChinese
English
Published 02.03.2021
Subjects
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