System and method for simultaneously detecting three-dimensional surface and thickness distribution of transparent material

• Main Authors: ZOU XINZHE, LING JUN, ZHANG YIJIAN, MU YAQIN, ZOU RONG
• Format: Patent
• Language: Chinese; English
• Published: 02.02.2021
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention provides a system for simultaneously detecting three-dimensional surface and thickness distribution of a transparent material. The system comprises an image acquisition module, a depth sensor, an area light source, a reference panel, the transparent material and a control unit; the image acquisition module is used for acquiring a polarization image and a depth image of the transparent material and transmitting the images to the control unit; the depth sensor is used for collecting front and back depth values of the transparent material; the area light source is used for emittingnon-polarized white light to irradiate the transparent material; the reference panel is used for placing a background pattern; and the control unit comprises a normal vector calculation module based on polarization characteristics, a normal vector correction module based on a depth sensor, and a reconstruction and detection module. According to the invention, three-dimensional surface detection can be carried out on the l