Chip test equipment

• Main Authors: WEI XIUQIANG, SONG KEJIANG, HUANG SIQI, PENG QI, YAN DAPENG
• Format: Patent
• Language: Chinese; English
• Published: 20.11.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The embodiment of the invention relates to the technical field of chip testing, and provides chip test equipment. The chip test equipment comprises a material taking mechanism, a test positioning mechanism, a power-up mechanism, a water injection mechanism and a test mechanism which are respectively installed on a test bench, wherein the material taking mechanism is located at one side of the testpositioning mechanism and is used for placing the obtained chip on the test positioning mechanism and taking away the chip after the test is completed; the power-up mechanism is located on the otherside of the test positioning mechanism and used for powering up the chip on the test positioning mechanism; the water injection mechanism is connected with the test positioning mechanism and is used for carrying out heat dissipation and cooling on the chip located on the test positioning mechanism; the test mechanism comprises an integrating sphere, and a light inlet of the integrating sphere is close to the light outlet e