Experimental device for characterizing resistance conversion characteristic of superconducting TES single-photon detector in PPMS

• Main Authors: ZHONG JIAQIANG, SHI SHENGCAI, YAO QIJUN, GENG YUE, WANG ZHENG, WU FENG, ZHANG WEN, LI PEIZHAN
• Format: Patent
• Language: Chinese; English
• Published: 17.11.2020
• Subjects: COLORIMETRY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; RADIATION PYROMETRY; TESTING

The invention discloses an experimental device for characterizing the resistance conversion characteristic of a superconducting TES single-photon detector in PPMS, and the device comprises a PPMS system, a substrate, a shielding case, and a circuit board of an integrated filter, and the shielding case, the circuit board of the integrated filter, and the to-be-detected superconducting TES single-photon detector are all disposed on the substrate. In the experimental device, the shielding case is a normal conductor in the ADR refrigerator magnetization process, normal work of the shielding case is not affected, when an external magnetic field is removed and the temperature is reduced to be lower than the set temperature, the shielding case enters a superconducting state, a residual magnetic field in a PPMS system is eliminated, and therefore the measurement precision of the resistance conversion characteristic of the superconducting TES single-photon detector is guaranteed; meanwhile, thelow-pass filter is used