Loop resistance tester and control method thereof

• Main Authors: SU CHAO, LAI JUNJU, HU JINLEI
• Format: Patent
• Language: Chinese; English
• Published: 03.11.2020
• Subjects: CONTROLLING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; REGULATING; SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES; TESTING

The embodiment of the invention provides a loop resistance tester and a control method thereof. The loop resistance tester comprises at least one battery, a current-limiting resistor, a charging capacitor, a bus capacitor and a semiconductor device group, wherein the semiconductor device group comprises a first semiconductor device, a second semiconductor device, a third semiconductor device and afourth semiconductor device; the second semiconductor device and the third semiconductor device are disconnected in the charging stage of the loop resistance tester and are connected in the power supply stage of the loop resistance tester; and the first semiconductor device and the fourth semiconductor device are used for conducting the battery, the current-limiting resistor and the first capacitor in the charging stage and stopping the discharge current from flowing from the first end of the charging capacitor to the second end of the charging capacitor in the power supply stage. According to the technical scheme pr